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Installation for measuring of thermal conductivity by laser flash-method
(Diamond Materials Laboratory)

Chevokin

The unit is designed to measure the thermal diffusivity and thermal conductivity of the plates, thin films, membranes thickness 0,01-2 mm with laser flash method in the temperature range from -100 to 250 0C
Contactless method requires minimal sample preparation, is suitable for measuring materials with high thermal conductivity (2400 W / m * K and above).
The method is based on measuring the propagation time of a heat wave, created by a laser pulse from one side of the film or plate to the opposite side. The heat source is a short pulse Nd: YAG laser, and the passage of the heat wave is defined by a high-speed HgCdTe infrared detector, which measures the temperature of the other side of the sample:


Specifications Nd:YAG laser.


Wavelength                                                          

1.064 ìêì.

Pulse energy (max)          

75 mJ

Pulse duration                                

   10±3 íñ

Pulse repetition frequency                                        

1 Hz

Parameters of the IR detector


Operating temperature
-198 0Ñ

Operating speed                   

300 ns

The wavelength of maximum sensitivity

10.0 um

 

 

 
 


 
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