The SOLVER P47-PRO SPM is a universal tool for the complex research of different objects in air, liquid and controlled gas environments with sample heating up to 130°C. Scanning-by-sample scheme realized in the microscope provides the highest resolution in the class. Time-proven technical solutions are the base for high reliability and measurement accuracy. The construction makes the work with the system pleasant and easy. It can be used for routine measurements in small companies and university laboratories as well as in big research centers.

Key features:

• Device has its own vibration isolation system for obtaining ultra-high resolution (up to atomic) without additional vibration isolation
• Scanning Tunnel Microscopy, Atomic-Force Microscopy and Shear Force (the method that allows using optical fiber as a probe) combined in one device
• Study in liquids, controlled gas environment and in temperatures up to 150^оС
• Interactive management system and software setting of modes and functional scheme of device
• Saving settings to separate files allows a beginner working with almost any of the available up-to-date methods of scanning probe microscopy
• Skilled user may design and implement his own methods, including multipass ones
  

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